Standard IEC standard · IEC 60747-5-3:1997

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Status: Upphävd

· Ersätts av: IEC 60747-5-5:2007/AMD1:2013 , IEC 60747-5-4:2006 , IEC 60747-5-6:2016 , IEC 60747-5-7:2016 , IEC 60747-5-5:2007 Tillägg: IEC 60747-5-3:1997/AMD1:2002
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Standard IEC standard · IEC 60747-5-3:1997

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
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Omfattning
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

Ämnesområden

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Köp denna standard

Standard IEC standard · IEC 60747-5-3:1997

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Prenumerera på standarden - Läs mer Dölj
Pris: 4 095 SEK
standard ikon pdf

PDF

Pris: 4 095 SEK
standard ikon

Papper

Fler alternativ Färre alternativ

Produktinformation

Språk: Engelska Franska

Framtagen av: IEC

Internationell titel: Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Artikelnummer: STD-124433

Utgåva: 1

Fastställd: 1997-09-05

Antal sidor: 61

Ersätter: IEC 60747-5:1992/AMD2:1995 , IEC 60747-5:1992/AMD1:1994 , IEC 60747-5:1992

Ersätts av: IEC 60747-5-5:2007/AMD1:2013 , IEC 60747-5-4:2006 , IEC 60747-5-6:2016 , IEC 60747-5-7:2016 , IEC 60747-5-5:2007